Clearing up the fundamentals of static electricity, these readings give an account of the semiconductor's breakdown caused by static, the problem caused by dust and foreign particles, and their countermeasures. They point out controversial points in the current methods, adduce new ideas and process, and introduce their application examples.
※These are to be issued in series.
TRINC LIBRARY > Static electricity readings (No.1: Static and dust fundamentals - 1)
  • <No.39> Static and dust fundamentals -39

Serialization No.39

Static and Dust Fundamentals - 39
(Table of contents)


Until the last number, we had covered 2 Problems caused by the static, 3 Fundamentals of the static, 4 Fundamentals of dust, 5 Fundamentals of antistatic and anti-dust measures, and 6 Antistatic and anti-dust measures of new age. In this number we discuss a sequel to 7 Anti-static/dust measures with full of errors.

7.Antistatic and anti-dust measures with full of errors

 7-12. Anti-static/dust device (ion-assisted dedusting device)

  7-12-1. An ion-assisted dedusting device attracting dust to the object
  7-12-2. Harmful air curtain
  7-12-3. Power consuming air-curtain
  7-12-4. New dust collecting device “Air-blow Desktop TRINC”
   1. Innovative appearance
   2. Innovative structure and performance
   3. Innovative performance








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