Clearing up the fundamentals of static electricity, these readings give an account of the semiconductor's breakdown caused by static, the problem caused by dust and foreign particles, and their countermeasures. They point out controversial points in the current methods, adduce new ideas and process, and introduce their application examples.
※These are to be issued in series.
TRINC LIBRARY > Static electricity readings (No.1: Static and dust fundamentals - 1)
  • <No.28> Static and dust fundamentals -28

Serialization No.28

Static and Dust Fundamentals - 28
(Table of contents)


Until the last number, we had covered 2 Problems caused by the static, 3 Fundamentals of the static, 4 Fundamentals of dust, 5 Fundamentals of antistatic and anti-dust measures, and 6 Antistatic and anti-dust measures of new age. We continue on 6 Antistatic and anti-dust measures of new age in this number.

7.Antistatic and anti-dust measures with full of errors

 7-1 With-air (air aided) ionization

  7-1-1.Air aided ionizing: controversial issues
    (1) It increases dust-related failures.
    (2) The air created by ionizer makes the “dust blown off” circulate.
    (3) The air caused by ionizers blows “the dust adhering to workers”
     off and raise in the air.
    (4) The air caused by ionizers raises “the dust piled up on workbenches,
      jigs and floor”
    (5) Wasting electricity
  7-1-2.Advantage of air-free ionizing
    (1) Principle of static elimination
    (2) Air is not required for static elimination.
    (3) Air is not beneficial but harmful for static elimination.
    (4) Making it “air-free ionizer” saves electricity 99.8%
  7-1-3.Conclusion








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