Clearing up the fundamentals of static electricity, these readings give an account of the semiconductor's breakdown caused by static, the problem caused by dust and foreign particles, and their countermeasures. They point out controversial points in the current methods, adduce new ideas and process, and introduce their application examples.
※These are to be issued in series.
TRINC LIBRARY > Static electricity readings (No.1: Static and dust fundamentals - 1)
  • <No.41> Static and dust fundamentals -41

Serialization No.41

Static and Dust Fundamentals - 41
(Table of contents)


Until the last number, we had covered 2 Problems caused by the static, 3 Fundamentals of the static, 4 Fundamentals of dust, 5 Fundamentals of antistatic and anti-dust measures, and 6 Antistatic and anti-dust measures of new age. In this number we discuss a sequel to 7 Anti-static/dust measures with full of errors.

7.Antistatic and anti-dust measures with full of errors

 7-14. Approved explosion-proof ionizer

  7-14-1. Are conventional approved explosion-proof ionizers safe?
  7-14-2. But, we can’t help saying “dangerous.”
  7-14-3. Conventional approved explosion-proof ionizers
   [1] Safety measures
   [2] Disputed issues
  7-14-4. TRINC’s approved explosion-proof construction
  7-14-5. TRINC’s safe approved explosion-proof ionizer
   [1] Gun-type
   [2] Spot-type
   [3] Bar-type
   [4] Space-type
  7-14-6. At the end of this number








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